BULLETIN
of the
POLISH ACADEMY of SCIENCES TECHNICAL SCIENCES |
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Volume
55, Issue 3, September 2007
Electronics |
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Issue Index | Authors Index | Scope Index | Web Info | |
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Aims&Scope, Subscription | Editors | Authors' guide | to read PDF files | mirror: http://fluid.ippt.gov.pl/~bulletin/ |
pp 273 - 280 |
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Finding of optimal excitation signal for testing of analog electronic circuits |
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L. CHRUSZCZYK, D. GRZECHCA and J. RUTKOWSKI |
This article presents combined approach to analog electronic circuits testing by means of evolutionary methods (genetic algorithms) and using some aspects of information theory utilisation and wavelet transformation. Purpose is to find optimal excitation signal, which maximises probability of fault detection and location. This paper focuses on most difficult case where very few (usually only input and output) nodes of integrated circuit under test are available. |
Key words: |
fault detection, fault location, dictionary fault diagnosis, analog electronic circuits, wavelet transform, genetic algorithm |
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Issue Index | Authors Index | Scope Index | Web Info |
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Aims&Scope, Subscription | Editors | Authors' guide | to read PDF files |
Copyright
® Bulletin of the Polish Academy of Sciences: Technical Sciences
6 October 2007, site prepared by KZ |
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