BULLETIN of the

POLISH ACADEMY of SCIENCES

TECHNICAL SCIENCES

 BULLETIN of the POLISH ACADEMY of SCIENCES: TECHNICAL SCIENCES
Volume 54, Issue 1, March 2006

Mechanical Engineering, Control and Informatics
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pp 25 - 32
PDF -  880 KB
Moving from micro- to nanoworld in optical domain scanning probe microscopy
J. RADOJEWSKI
 

In the article we described the evolution of optical technology from lens-type microscopes working in far-field to SNOM (Scanning
Near-Field Optical Microscopy) constructions. We considered two systems elaborated in our laboratory, namely PSTM system (Photon Scanning Tunelling Microscope) and SNOM system. In both systems we obtained subwavelength resolution. Some details about optical point probe technology in both systems are given and experimental results presented.
Keywords:
optical Microscopy, PSTM, SNOM, tip technology, piezoresistive cantilever
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